The "Dr. Allen V. Astin" Award
High-Capacity Mass Dissemination with Four-Position Mass Comparator
Arthur Reichmuth
Mettler Toledo
Greifensee, Switzerland
This paper discusses the basic elements of mass dissemination, and
requirements of high-capacity mass dissemination as it is used to
calibrated weights and wieght sets. A new mass comparator for high
capacity mass dissemination is introduced, with actual results of the
comparator's capability, and presents addtional applications of the
device
Applied Category
High-Capacity Mass Dissemination with Four-Position Mass Comparator
Arthur Reichmuth
Mettler Toledo
Greifensee, Switzerland
This paper discusses the basic elements of mass dissemination, and
requirements of high-capacity mass dissemination as it is used to
calibrated weights and wieght sets. A new mass comparator for high
capacity mass dissemination is introduced, with actual results of the
comparator's capability, and presents addtional applications of the
device
Invited Category
Improving Temperature Accuracy for Rapid Thermal Processing at NIST
B.K. Tsai and D.P. Dewitt
NIST
Gaithersburg, MD
This paper presents methods to improve measurement accuracy of
semiconductor materials undergoing high-temperature thermal
processing,
with a goal of 2 degrees Celsius from 700 to 1000 degrees C. New
methods
for calibrating lightpipe radiation thermometers against blackbody
sources
are introduced. While the work specifically addresses a semiconductor
application, the approaches have geneal applicability for acheiving
reliable traceable temperature measurements in other material
processing
and manufacturing environments.
Quality Management Category
Facing the Challenge of Measurement Interoperability: Taiwan's Dilemmas in the establishment of a National Measurement System
Tzeng-Yow Lin
National Measurement Laboratory, Center for
Measurement Standards (CMS-NML)
Hsinchu, Taiwan
Taiwan has been recognized as an important base for product
development
with flexible
manufacture and dynamic design in a global product value chain.
Characteristics of Taiwan
industry are analyzed, and special attentions are paid to electronics
and
IC industries. The national measurement system is introduced briefly,
including CMS-NML and CNLA. Besides primary calibrations, CMS-NML is
strongly requested by the
government and Taiwan industry to apply the standards-based
technologies to
promote the
competitiveness of Taiwan companies. Examples are given to
demonstrate the
supports of
CMS-NML to electronics, petroleum and emerging industries.
Technical Category
One Port Characterized Devices in Vector
Network Analyzer Calibrations: Theory and Experiments
Godfrey Kwan
Agilent Technologies, Electrical Standards
Laboratory
Rohnert Park, CA
This paper we presents the results of a study on the use of
characterized
devices in microwave
vector network analyzer (VNA) calibrations and measurements. A brief
review
of the
theory of one-port characterized device calibration is given. The
scattering parameter error
box representation and widely used terminology of error terms in one-
port
VNA calibrations
such as directivity, source match and tracking are adopted in this
paper.
Based on these
parameters, the quality of one class of one-port VNA calibrations
achievable
through the use of characterized devices and the effects of different
kinds
of errors in device
characterization can have on VNA calibrations are examined.
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