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NCSL International - Standards & Practices Committees
Standards and Practices

Committee work is done through permanent volunteer committees made up of of NCSLI Members that meet on a quarterly basis. One of the best ways to become involved with NCSLI is to serve on one of our many committees. Committee members work together to advance projects, study and deliberate current metrology issues.

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Committee Meeting Schedule Q2 2022

Standards and Practices

Ryan Kelly

Calibration System Resources Committee

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Mark Kuster

Metrology Practices Committee

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Mark Kuster

Calibration Intervals Committee

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Howard Castrup

Measurement Decision Risk Committee

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Ryan Kelly

Ryan’s Metrology career started in the Marine Corps where he spent nine years performing calibration and repair on fixed-wing aircraft. From there, he spent a few months as a calibration technician for a 3rd party provider before becoming a contracted Metrologist for Lockheed Martin. After his contract, Ryan continued his work with Lockheed Martin as a lead technician performing calibrations and developing automated procedures. Since 2021, Ryan has been employed with Agilent Technologies as their Enterprise Metrology Manager overseeing several US customer accounts. He is actively working towards a dual major in Computer Science and Computer Technology.”

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Mark Kuster

Mark Kuster holds Bachelor of Science degrees in Electrical Engineering and Physics from Southern Methodist University and a Master of Science degree in Electrical Engineering from the Georgia Institute of Technology. He consults with 30 years of metrology experience. He chairs the NCSLI 173 Metrology Practices and 141 MII & Automation Committees, writes the Metrologist "Toward a Measurement Information Infrastructure Column", and serves as Managing Editor for NCSLI Measure: The Journal of Measurement Science.

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Mark kuster

Mark Kuster holds Bachelor of Science degrees in Electrical Engineering and Physics from Southern Methodist University and a Master of Science degree in Electrical Engineering from the Georgia Institute of Technology. He consults with 30 years of metrology experience. He chairs the NCSLI 173 Metrology Practices and 141 MII & Automation Committees, writes the Metrologist "Toward a Measurement Information Infrastructure Column", and serves as Managing Editor for NCSLI Measure: The Journal of Measurement Science.

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Howard Castrup

Dr. Castrup received a B.S. in Engineering (Solid State Electronics) from UCLA in 1972 and a Ph.D. in Engineering (Solid State Electronics) from UCLA in 1981. He is a member of IEEE, Sigma Pi Sigma, AIP, AAPT, is the chairman of the NCSLI Metrology Practices Committee and is the recipient of both the Wildhack and Woodington awards.He has been developing advanced measurement science techniques and methods for over thirty-six years, has worked as a Microwave Electronics Instructor, an RF and Microwave Metrology Engineer, a Statistician, a Systems Analyst, a Project Manager, and is now president of Integrated Sciences Group (ISG), developing new analytical methodologies and implementing them in scientific and engineering software. His recent activities include participation in the development of several NCSLI RPs and serving as a primary author of NASA-HNBK-8739.19 on measurement quality assurance.

Howard Castrup

Statistical Process Control Methods Committee

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Howard Castrup

Measurement Decision Support Committee

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Suzanne Castrup

Measurement Uncertainty Analysis Committee

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Roger Burton

Accredited Standards Committee Z540

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Howard Castrup

Dr. Castrup received a B.S. in Engineering (Solid State Electronics) from UCLA in 1972 and a Ph.D. in Engineering (Solid State Electronics) from UCLA in 1981. He is a member of IEEE, Sigma Pi Sigma, AIP, AAPT, is the chairman of the NCSLI Metrology Practices Committee and is the recipient of both the Wildhack and Woodington awards.He has been developing advanced measurement science techniques and methods for over thirty-six years, has worked as a Microwave Electronics Instructor, an RF and Microwave Metrology Engineer, a Statistician, a Systems Analyst, a Project Manager, and is now president of Integrated Sciences Group (ISG), developing new analytical methodologies and implementing them in scientific and engineering software. His recent activities include participation in the development of several NCSLI RPs and serving as a primary author of NASA-HNBK-8739.19 on measurement quality assurance.

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Howard Castrup

Dr. Castrup received a B.S. in Engineering (Solid State Electronics) from UCLA in 1972 and a Ph.D. in Engineering (Solid State Electronics) from UCLA in 1981. He is a member of IEEE, Sigma Pi Sigma, AIP, AAPT, is the chairman of the NCSLI Metrology Practices Committee and is the recipient of both the Wildhack and Woodington awards.He has been developing advanced measurement science techniques and methods for over thirty-six years, has worked as a Microwave Electronics Instructor, an RF and Microwave Metrology Engineer, a Statistician, a Systems Analyst, a Project Manager, and is now president of Integrated Sciences Group (ISG), developing new analytical methodologies and implementing them in scientific and engineering software. His recent activities include participation in the development of several NCSLI RPs and serving as a primary author of NASA-HNBK-8739.19 on measurement quality assurance.

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Roger Burton

Roger Burton is a Manager at the Primary Standards Laboratory at Sandia National Laboratories in Albuquerque, New Mexico. He earned a B.S. in Mechanical Engineering from the University of Missouri at Kansas City and an M.S. in Mechanical Engineering from the University of Missouri at Columbia. He is a registered Professional Engineer in Missouri and has over thirty-five years of experience in Metrology, specializing in dimensional measurements and primary electrical standards. Roger serves on the DOE Metrology Committee and is authorized as a Lead Assessor and Technical Assessor for the National Voluntary Laboratory Accreditation Program (NVLAP). Roger is a Past President of NCSLI and currently serves as the Chair of the Z540 Standards Writing Committee. In addition, Roger also served as the NCSLI Kansas City Section Coordinator, VP of the Southeastern Division, VP of the Central Division, VP of Operations, and Treasurer.

Domenic Mallozzi

Accredited Standards Committee Z540

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James Salsbury

Dimensional Metrology Committee

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domenic mallozi

Dom started as a technician in 1977 for various calibration laboratories in Rhode Island where he grew up. He obtained a BSEE degree from the University of Rhode Island and was then employed by the Raytheon Company in MA from 1981 through 2019, retiring as a Principal Electrical Engineer specializing in Metrology. He continues to be interested in calibration quality systems. Since leaving Raytheon he has been a consultant in Metrology and also Public Safety Radio Systems. In addition, he has held an ASQ-CCT in the past and also currently holds an FCC General Radio Operators License with Radar Endorsement and an Extra Class Amateur Radio Operators License (N1DM). He has contributed to various NCSLI handbooks and other publications over the years. Dom lives in Natick, MA with his wife Karen of 40+ years. They enjoy travelling in New England and spending time with their daughter, Nina and son-in-law, Kevin. Dom is active in Amateur Radio from short wave through satellite work in the UHF bands.

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James Salsbury

Dr. Jim Salsbury is the General Manager of Corporate Metrology at Mitutoyo America Corporation. He is involved with new technology, advanced applications, calibration, quality, and education. Dr. Salsbury is an active participant in national and international standards efforts in dimensional metrology and tolerancing, including being a member of the ASME B89 Main Committee and a U.S. appointed subject matter expert to ISO/TC 213. Dr. Salsbury also serves NCSL International as the chair of the Dimensional Metrology Committee, a past board member, and past coordinator of the Chicago section. Dr. Salsbury has been working in the measurement field for over 25 years and has been with Mitutoyo since 2000. He received his doctoral degree from the Center for Precision Metrology at the University of North Carolina at Charlotte.